TSOM
id:
tsom-180-1573851
title:
TSOM
text:
Through-Focus Scanning Optical Microscopy (TSOM) is an imaging method that produces nanometer-scale three-dimensional measurement sensitivity using a conventional bright-field optical microscope. TSOM has been introduced and maintained by Ravikiran Attota at NIST. It was given an R&D 100 Award in 2010. In the TSOM method a target is scanned through the focus of an optical microscope, acquiring conventional optical images at different focal positions. The TSOM images are constructed using the thr
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/TSOM
date created:
2011-09-20T11:25:04Z
date modified:
2024-09-05T08:14:07Z
main entity:
{"identifier":"Q7671610","url":"https://www.wikidata.org/entity/Q7671610"}
image:
fields total:
13
integrity:
14