Total internal reflection microscopy
id:
total-internal-reflection-microscopy-324-9564795
title:
Total internal reflection microscopy
text:
Total internal reflection microscopy is a specialized optical imaging technique for object tracking and detection utilizing the light scattered from an evanescent field in the vicinity of a dielectric interface. Its advantages are a high signal-to-noise ratio and a high spatial resolution in the vertical dimension.
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Total_internal_reflection_microscopy
date created:
date modified:
2023-12-04T00:56:09Z
main entity:
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image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/b/b6/Total_internal_reflection_scattering.svg","width":390,"height":265}
fields total:
13
integrity:
14