Stuck-at fault
id:
stuck-at-fault-191-571665
title:
Stuck-at fault
text:
A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to assure that a manufacturing defect with that type of behavior can be found with a specific test pattern. Likewise the input could be tied to a logical 0 to mod
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Stuck-at_fault
date created:
date modified:
2020-03-04T15:20:44Z
main entity:
{"identifier":"Q7627418","url":"https://www.wikidata.org/entity/Q7627418"}
image:
fields total:
13
integrity:
13