Scanning voltage microscopy
id:
scanning-voltage-microscopy-207-2357471
title:
Scanning voltage microscopy
text:
Scanning voltage microscopy (SVM), sometimes also called nanopotentiometry, is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or optoelectronic sample. By connecting the probe to a high-impedance voltmeter and rastering over the sample's surface, a map of the electric potential can be acquired. SVM is generally nondestructive to the sample although so
brand slug:
wiki
category slug:
encyclopedia
description:
Scientific experimental technique
original url:
https://en.wikipedia.org/wiki/Scanning_voltage_microscopy
date created:
2004-07-28T22:02:48Z
date modified:
2024-09-11T03:28:28Z
main entity:
{"identifier":"Q7430081","url":"https://www.wikidata.org/entity/Q7430081"}
image:
fields total:
13
integrity:
15