Scanning joule expansion microscopy
id:
scanning-joule-expansion-microscopy-202-9913323
title:
Scanning joule expansion microscopy
text:
In microscopy, scanning joule expansion microscopy (SJEM) is a form of scanning probe microscopy heavily based on atomic force microscopy (AFM) that maps the temperature distribution along a surface. Resolutions down to 10 nm have been achieved and 1 nm resolution is theoretically possible. Thermal measurements at the nanometer scale are of both academic and industrial interest, particularly in regards to nanomaterials and modern integrated circuits.
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Scanning_joule_expansion_microscopy
date created:
date modified:
2022-09-25T05:51:26Z
main entity:
{"identifier":"Q7430069","url":"https://www.wikidata.org/entity/Q7430069"}
image:
fields total:
13
integrity:
13