Scanning helium ion microscope
id:
scanning-helium-ion-microscope-202-16097074
title:
Scanning helium ion microscope
text:
A scanning helium ion microscope is an imaging technology based on a scanning helium ion beam. Similar to other focused ion beam techniques, it allows to combine milling and cutting of samples with their observation at sub-nanometer resolution. In terms of imaging, SHIM has several advantages over the traditional scanning electron microscope (SEM). Owing to the very high source brightness, and the short De Broglie wavelength of the helium ions, which is inversely proportional to their momentum,
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Scanning_helium_ion_microscope
date created:
date modified:
2023-09-21T07:06:33Z
main entity:
{"identifier":"Q55236","url":"https://www.wikidata.org/entity/Q55236"}
image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/6/6f/ORION_NanoFab_-_Helium_Ion_Microscope_%288410606251%29.jpg","width":3107,"height":3388}
fields total:
13
integrity:
14