Probe card
id:
probe-card-323-14390478
title:
Probe card
text:
A probe card is used in automated integrated circuit testing. It is an interface between an electronic test system and a semiconductor wafer.
brand slug:
wiki
category slug:
encyclopedia
description:
Interface between an electronic test system and a semiconductor wafer
original url:
https://en.wikipedia.org/wiki/Probe_card
date created:
date modified:
2023-06-07T01:05:45Z
main entity:
{"identifier":"Q7246919","url":"https://www.wikidata.org/entity/Q7246919"}
image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/d/dc/Probe_card.JPG","width":2448,"height":3264}
fields total:
13
integrity:
15