Optical beam-induced current
id:
optical-beam-induced-current-244-9202837
title:
Optical beam-induced current
text:
Optical beam induced current (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may be analyzed to determine the sample's properties, especially defects or anomalies. Conventional OBIC scans an ultrafast laser beam over the surface of the sample, exciting some electrons into the conduction band through what is known as 'single-photon abs
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Optical_beam-induced_current
date created:
date modified:
2020-04-04T17:25:22Z
main entity:
{"identifier":"Q3694425","url":"https://www.wikidata.org/entity/Q3694425"}
image:
fields total:
13
integrity:
13