Non-contact atomic force microscopy
id:
non-contact-atomic-force-microscopy-323-15361530
title:
Non-contact atomic force microscopy
text:
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon cantilever or a quartz crystal resonator. During measurements the
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Non-contact_atomic_force_microscopy
date created:
date modified:
2024-02-02T12:15:06Z
main entity:
{"identifier":"Q16029538","url":"https://www.wikidata.org/entity/Q16029538"}
image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/d/d6/NTCDI_AFM2.jpg","width":334,"height":516}
fields total:
13
integrity:
14