Nanoscale secondary ion mass spectrometry
id:
nanoscale-secondary-ion-mass-spectrometry-166-4785593
title:
Nanoscale secondary ion mass spectrometry
text:
NanoSIMS is an analytical instrument manufactured by CAMECA which operates on the principle of secondary ion mass spectrometry. The NanoSIMS is used to acquire nanoscale resolution measurements of the elemental and isotopic composition of a sample. The NanoSIMS is able to create nanoscale maps of elemental or isotopic distribution, parallel acquisition of up to seven masses, isotopic identification, high mass resolution, subparts-per-million sensitivity with spatial resolution down to 50 nm. The
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Nanoscale_secondary_ion_mass_spectrometry
date created:
2015-01-14T13:05:59Z
date modified:
2024-08-29T18:47:15Z
main entity:
{"identifier":"Q56456","url":"https://www.wikidata.org/entity/Q56456"}
image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/a/af/NanoSIMS50_instrument_diagram.png","width":1109,"height":841}
fields total:
13
integrity:
15