Mechanical probe station
id:
mechanical-probe-station-292-15664464
title:
Mechanical probe station
text:
A mechanical probe station is used to physically acquire signals from the internal nodes of a semiconductor device. The probe station utilizes manipulators which allow the precise positioning of thin needles on the surface of a semiconductor device. If the device is being electrically stimulated, the signal is acquired by the mechanical probe and is displayed on an
oscilloscope or SMU. The mechanical probe station is often used in the failure analysis of semiconductor devices. There are two type
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Mechanical_probe_station
date created:
date modified:
2023-01-17T17:20:57Z
main entity:
{"identifier":"Q3968797","url":"https://www.wikidata.org/entity/Q3968797"}
image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/2/26/Cascade_Microtech_probe_station.jpg","width":3252,"height":2439}
fields total:
13
integrity:
14