Low-energy electron microscopy
id:
low-energy-electron-microscopy-282-3732397
title:
Low-energy electron microscopy
text:
Low-energy electron microscopy, or LEEM, is an analytical surface science technique used to image atomically clean surfaces, atom-surface interactions, and thin (crystalline) films. In LEEM, high-energy electrons are emitted from an electron gun, focused using a set of condenser optics, and sent through a magnetic beam deflector. The “fast” electrons travel through an objective lens and begin decelerating to low energies near the sample surface because the sample is held at a potential near that
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Low-energy_electron_microscopy
date created:
date modified:
2024-03-23T19:45:47Z
main entity:
{"identifier":"Q908748","url":"https://www.wikidata.org/entity/Q908748"}
image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/c/c8/UIUC_LEEM.jpg","width":992,"height":698}
fields total:
13
integrity:
14