Kelvin probe force microscope
id:
kelvin-probe-force-microscope-218-587527
title:
Kelvin probe force microscope
text:
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a nonchalant variant of atomic force microscopy (AFM). By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. When there is little or no magnification, this approach can be described as using a scanning Kelvin probe (SKP). These techniques are predominantly used to measure corrosion and coatings. With KPFM, the work function of surfaces can
brand slug:
wiki
category slug:
encyclopedia
description:
Noncontact variant of atomic force microscopy
original url:
https://en.wikipedia.org/wiki/Kelvin_probe_force_microscope
date created:
2005-07-10T19:55:29Z
date modified:
2024-09-13T06:32:52Z
main entity:
{"identifier":"Q1324110","url":"https://www.wikidata.org/entity/Q1324110"}
image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/c/cd/Kelvin_probe_force_microscopy.svg","width":860,"height":470}
fields total:
13
integrity:
16