IEEE Design & Test
id:
ieee-design-test-288-13008713
title:
IEEE Design & Test
text:
IEEE Design & Test, or simply Design & Test, is a magazine is cosponsored by the Council on EDA, Circuits and Systems Society, and the IEEE Solid State Circuits Society of the IEEE offering original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. T
brand slug:
wiki
category slug:
encyclopedia
description:
Academic journal
original url:
https://en.wikipedia.org/wiki/IEEE_Design_%26_Test
date created:
date modified:
2023-06-17T14:39:56Z
main entity:
{"identifier":"Q15762232","url":"https://www.wikidata.org/entity/Q15762232"}
image:
fields total:
13
integrity:
14