Iddq testing
id:
iddq-testing-274-2787829
title:
Iddq testing
text:
Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state. The current consumed in the state is commonly called Iddq for Idd (quiescent) and hence the name. Iddq testing uses the principle that in a correctly operating quiescent CMOS digital circuit, there is no static current path between the power supply and ground, except for a small amount of leakage. Many common semiconductor
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Iddq_testing
date created:
date modified:
2020-10-18T06:41:02Z
main entity:
{"identifier":"Q5987815","url":"https://www.wikidata.org/entity/Q5987815"}
image:
fields total:
13
integrity:
13