Hot-point probe
id:
hot-point-probe-172-13507086
title:
Hot-point probe
text:
A hot point probe is a method of quickly determining whether a semiconductor sample is n-type or p-type. The sample is probed using a voltmeter or ammeter and a heat source, such as a soldering iron, is placed on one of the leads. The heat will cause charge carriers to move away from the lead. The heat from the probe creates an increased number of carriers, which then diffuse away from the contact point. This causes a current/voltage difference. For example, if the heat source is placed on the p
brand slug:
wiki
category slug:
encyclopedia
description:
Electrical probe for analysis of semiconductor components
original url:
https://en.wikipedia.org/wiki/Hot-point_probe
date created:
2009-10-06T02:40:40Z
date modified:
2024-09-01T21:45:36Z
main entity:
{"identifier":"Q5909572","url":"https://www.wikidata.org/entity/Q5909572"}
image:
fields total:
13
integrity:
15