High-temperature operating life
id:
high-temperature-operating-life-271-437718
title:
High-temperature operating life
text:
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals. This reliability stress test is sometimes referred to as a lifetime test, device life test or extended burn in test and is used to trigger potential failure mo
brand slug:
wiki
category slug:
encyclopedia
description:
Reliability test applied to integrated circuits
original url:
https://en.wikipedia.org/wiki/High-temperature_operating_life
date created:
date modified:
2024-02-29T20:00:26Z
main entity:
{"identifier":"Q17029762","url":"https://www.wikidata.org/entity/Q17029762"}
image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/2/28/Static_.jpg","width":960,"height":720}
fields total:
13
integrity:
15