Focused ion beam
id:
focused-ion-beam-257-18264710
title:
Focused ion beam
text:
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, a FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system
brand slug:
wiki
category slug:
encyclopedia
description:
Device
original url:
https://en.wikipedia.org/wiki/Focused_ion_beam
date created:
date modified:
2024-03-02T22:07:52Z
main entity:
{"identifier":"Q258563","url":"https://www.wikidata.org/entity/Q258563"}
image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/1/14/Fib.jpg","width":801,"height":685}
fields total:
13
integrity:
15