Fluctuation electron microscopy
id:
fluctuation-electron-microscopy-295-5338941
title:
Fluctuation electron microscopy
text:
Fluctuation electron microscopy (FEM), originally called Variable Coherence Microscopy before decoherence effects in the sample rendered that naming moot, is a technique in electron microscopy that probes nanometer-scale or "medium-range" order in disordered materials. The first studies were performed on amorphous Si and later on hydrogenated amorphous silicon.
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Fluctuation_electron_microscopy
date created:
date modified:
2024-03-17T20:56:12Z
main entity:
{"identifier":"Q28457037","url":"https://www.wikidata.org/entity/Q28457037"}
image:
fields total:
13
integrity:
13