Ellipsometry
id:
ellipsometry-198-1800092
title:
Ellipsometry
text:
Ellipsometry is an optical technique for investigating the dielectric properties of thin films. Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model. It can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being inve
brand slug:
wiki
category slug:
encyclopedia
description:
Optical technique for characterizing thin films
original url:
https://en.wikipedia.org/wiki/Ellipsometry
date created:
date modified:
2023-12-06T04:34:05Z
main entity:
{"identifier":"Q898774","url":"https://www.wikidata.org/entity/Q898774"}
image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/4/4a/Ellipsometer_at_LAAS.jpg","width":3872,"height":2592}
fields total:
13
integrity:
15