Drive-level capacitance profiling
id:
drive-level-capacitance-profiling-320-10060433
title:
Drive-level capacitance profiling
text:
Drive-level capacitance profiling (DLCP) is a type of capacitance–voltage-profiling characterization technique developed specifically for amorphous and polycrystalline materials, which have more anomalies such as deep levels, interface states, or non-uniformities. Whereas in standard C–V profiles the charge response is assumed to be linear (dQ = CdV), in DLCP profiles the charge response is expected to have significant non-linear behavior (dQ = C0dV + C1(dV)2 + C2(dV)3) due to the significant la
brand slug:
wiki
category slug:
encyclopedia
description:
Technique for characterizing semiconductor materials
original url:
https://en.wikipedia.org/wiki/Drive-level_capacitance_profiling
date created:
date modified:
2023-08-23T05:17:04Z
main entity:
{"identifier":"Q5307910","url":"https://www.wikidata.org/entity/Q5307910"}
image:
fields total:
13
integrity:
14