Design for testing
id:
design-for-testing-233-11840776
title:
Design for testing
text:
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for cer
brand slug:
wiki
category slug:
encyclopedia
description:
IC design techniques that include testability features
original url:
https://en.wikipedia.org/wiki/Design_for_testing
date created:
date modified:
2024-02-25T14:52:12Z
main entity:
{"identifier":"Q5264347","url":"https://www.wikidata.org/entity/Q5264347"}
image:
fields total:
13
integrity:
14