Dark-field X-ray microscopy
id:
dark-field-x-ray-microscopy-182-18636165
title:
Dark-field X-ray microscopy
text:
Dark-field X-ray microscopy is an imaging technique used for multiscale structural characterisation. It is capable of mapping deeply embedded structural elements with nm-resolution using synchrotron X-ray diffraction-based imaging. The technique works by using scattered X-rays to create a high degree of contrast, and by measuring the intensity and spatial distribution of the diffracted beams, it is possible to obtain a three-dimensional map of the sample's structure, orientation, and local strai
brand slug:
wiki
category slug:
encyclopedia
description:
Synchrotron X-ray diffraction-based imaging technique
original url:
https://en.wikipedia.org/wiki/Dark-field_X-ray_microscopy
date created:
2023-04-01T15:14:21Z
date modified:
2024-09-06T14:15:35Z
main entity:
{"identifier":"Q121614464","url":"https://www.wikidata.org/entity/Q121614464"}
image:
fields total:
13
integrity:
15