Chemical force microscopy
id:
chemical-force-microscopy-256-9808010
title:
Chemical force microscopy
text:
In materials science, chemical force microscopy (CFM) is a variation of atomic force microscopy (AFM) which has become a versatile tool for characterization of materials surfaces. With AFM, structural morphology is probed using simple tapping or contact modes that utilize van der Waals interactions between tip and sample to maintain a constant probe deflection amplitude or maintain height while measuring tip deflection. CFM, on the other hand, uses chemical interactions between functionalized pr
brand slug:
wiki
category slug:
encyclopedia
description:
Method of microscopy which measures chemical bonding between the probe and surface
original url:
https://en.wikipedia.org/wiki/Chemical_force_microscopy
date created:
date modified:
2024-03-05T20:41:23Z
main entity:
{"identifier":"Q5090460","url":"https://www.wikidata.org/entity/Q5090460"}
image:
{"content_url":"https://upload.wikimedia.org/wikipedia/commons/3/3b/Figure1nnew.jpg","width":1280,"height":1024}
fields total:
13
integrity:
15