Capacitance–voltage profiling
id:
capacitance-voltage-profiling-321-2866681
title:
Capacitance–voltage profiling
text:
Capacitance–voltage profiling is a technique for characterizing semiconductor materials and devices. The applied voltage is varied, and the capacitance is measured and plotted as a function of voltage. The technique uses a metal–semiconductor junction or a p–n junction or a MOSFET to create a depletion region, a region which is empty of conducting electrons and holes, but may contain ionized donors and electrically active defects or traps. The depletion region with its ionized charges inside beh
brand slug:
wiki
category slug:
encyclopedia
description:
Technique for characterizing semiconductor materials and devices
original url:
https://en.wikipedia.org/wiki/Capacitance%E2%80%93voltage_profiling
date created:
date modified:
2023-07-14T08:48:57Z
main entity:
{"identifier":"Q5034476","url":"https://www.wikidata.org/entity/Q5034476"}
image:
fields total:
13
integrity:
14