Bimodal atomic force microscopy
id:
bimodal-atomic-force-microscopy-270-5661895
title:
Bimodal atomic force microscopy
text:
Bimodal Atomic Force Microscopy is an advanced atomic force microscopy technique characterized by generating high-spatial resolution maps of material properties. Topography, deformation, elastic modulus, viscosity coefficient or magnetic field maps might be generated. Bimodal AFM is based on the simultaneous excitation and detection of two eigenmodes (resonances) of a force microscope microcantilever.
brand slug:
wiki
category slug:
encyclopedia
description:
original url:
https://en.wikipedia.org/wiki/Bimodal_atomic_force_microscopy
date created:
date modified:
2024-01-04T20:28:33Z
main entity:
{"identifier":"Q112300524","url":"https://www.wikidata.org/entity/Q112300524"}
image:
fields total:
13
integrity:
13